Spectroscopic investigations of band offsets of MgO|AlxGa1-xN epitaxial heterostructures with varying AlN content.
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Epitaxial (111) Mg0 films were prepared on (0001) AlxGa1-xN via molecular-beam epitaxy for x=0 to x=0.67. Valence band offsets of Mg0 to AlxGa1-xN were measured using X-ray photoelectron spectroscopy as 1.65 ± 0.07 eV, 1.36 ± 0.05 eV, and1.05 ± 0.09 eV for x=0, 0.28, and 0.67, respectively. This yielded conduction band offsets of 2.75 eV, 2.39 eV, and 1.63 eV for x=0, 0.28, and 0.67, respectively. All band offsets measured between Mg0 and AlxGa1-xN provide a > 1 eV barrier height to the semiconductor.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- Grant/Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1512899
- Alternate ID(s):
- OSTI ID: 1229658
- Report Number(s):
- SAND-2015-8002J; 665186
- Journal Information:
- Applied Physics Letters, Vol. 107, Issue 10; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 11 works
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