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Title: Scanning Transmission X-ray Microscopy Probe for In Situ Mechanism Study of Graphene-oxide-based Resistive Random Access Memory

Authors:
; ; ; ; ;
Publication Date:
OSTI Identifier:
1229338
Report Number(s):
BNL--111413-2015-JA
Journal ID: ISSN 1600-5775
DOE Contract Number:
SC00112704
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 21; Journal Issue: 1
Publisher:
International Union of Crystallography
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English