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Title: In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films

Journal Article · · J. Appl. Phys.
DOI:https://doi.org/10.1063/1.4907394· OSTI ID:1170022

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
NSFU.S. ARMY RESEARCHOTHER; USDOE
Grant/Contract Number:
AC02- 06CH11357
OSTI ID:
1170022
Alternate ID(s):
OSTI ID: 1228527
Journal Information:
J. Appl. Phys., Vol. 117, Issue (5) ; 02, 2015
Country of Publication:
United States
Language:
ENGLISH
Citation Metrics:
Cited by: 34 works
Citation information provided by
Web of Science

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Ferroelectric/Ferroelastic domain wall motion in dense and porous tetragonal lead zirconate titanate films journal January 2015
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Thin-film ferroelectrics of PZT of sol-gel processing
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Cited By (7)

On the Origin of the Large Remanent Polarization in La:HfO 2 journal September 2019
Enhanced Ferroelectric Functionality in Flexible Lead Zirconate Titanate Films with In Situ Substrate‐Clamping Compensation journal July 2019
Quantitative and high spatial resolution d 33 measurement of piezoelectric bulk and thin films journal November 2015
Enhanced piezoelectricity of thin film hafnia-zirconia (HZO) by inorganic flexible substrates journal July 2018
Time-resolved X-ray diffraction study of the structural dynamics in an epitaxial ferroelectric thin Pb(Zr 0.2 Ti 0.8 )O 3 film induced by sub-coercive fields journal April 2019
Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process-Structure-Property Relations journal July 2016
Enhanced Ferroelectric Functionality in Flexible Lead Zirconate Titanate Films with In-Situ Substrate-Clamping Compensation preprint January 2019