Stability and migration of small copper clusters in amorphous dielectrics

Guzman, David M.; Onofrio, Nicolas; Strachan, Alejandro

doi:10.1063/1.4921059

Title: Stability and migration of small copper clusters in amorphous dielectrics

Journal Article · Mon May 18 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4921059· OSTI ID:1228179

Guzman, David M. ^[1];

^[1]; Strachan, Alejandro ^[1]

School of Materials Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907-2044, USA

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Sponsoring Organization:: USDOE

OSTI ID:: 1228179

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Vol. 117 Journal Issue: 19; ISSN 0021-8979

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 19 works

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References (44)

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