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Title: Spherical nanoindentation stress–strain curves

Although indentation experiments have long been used to measure the hardness and Young's modulus, the utility of this technique in analyzing the complete elastic–plastic response of materials under contact loading has only been realized in the past few years – mostly due to recent advances in testing equipment and analysis protocols. This paper provides a timely review of the recent progress made in this respect in extracting meaningful indentation stress–strain curves from the raw datasets measured in instrumented spherical nanoindentation experiments. These indentation stress–strain curves have produced highly reliable estimates of the indentation modulus and the indentation yield strength in the sample, as well as certain aspects of their post-yield behavior, and have been critically validated through numerical simulations using finite element models as well as direct in situ scanning electron microscopy (SEM) measurements on micro-pillars. Much of this recent progress was made possible through the introduction of a new measure of indentation strain and the development of new protocols to locate the effective zero-point of initial contact between the indenter and the sample in the measured datasets. As a result, this has led to an important key advance in this field where it is now possible to reliably identifymore » and analyze the initial loading segment in the indentation experiments.« less
 [1] ;  [2]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  2. Georgia Inst. of Technology, Atlanta, GA (United States)
Publication Date:
OSTI Identifier:
Report Number(s):
Journal ID: ISSN 0927-796X; PII: S0927796X15000157
Grant/Contract Number:
W911NF-10-1-0409; AC52-06NA25396
Accepted Manuscript
Journal Name:
Materials Science and Engineering. R, Reports
Additional Journal Information:
Journal Volume: 91; Journal Issue: C; Journal ID: ISSN 0927-796X
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
Country of Publication:
United States
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; nanoindentation; electron backscatter diffraction (EBSD); orientation imaging microscopy (OIM); polycrystalline metals; slip resistance; grain boundaries; pop-ins; Raman Spectroscopy