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Title: MultiRef: software platform for Rietveld refinement of multiple powder diffractograms from in situ, scanning or diffraction tomography experiments

Authors:
;  [1]
  1. Aarhus
Publication Date:
OSTI Identifier:
1227478
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 48; Journal Issue: (6) ; 12, 2015
Publisher:
International Union of Crystallography
Research Org:
Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US)
Sponsoring Org:
OTHER
Country of Publication:
United States
Language:
ENGLISH