Single-vortex pinning and penetration depth in superconducting NdFeAsO1-xFx

Zhang, Jessie T.; Kim, Jeehoon; Huefner, Magdalena; Ye, Cun; Kim, Stella; Canfield, Paul C.; Prozorov, Ruslan; Auslaender, Ophir M.; Hoffman, Jennifer E.

doi:10.1103/PhysRevB.92.134509

Title: Single-vortex pinning and penetration depth in superconducting NdFeAsO_1-xF_x

Journal Article · Mon Oct 12 00:00:00 EDT 2015 · Physical Review. B, Condensed Matter and Materials Physics

DOI:https://doi.org/10.1103/PhysRevB.92.134509· OSTI ID:1227430

Zhang, Jessie T. ^[1]; Kim, Jeehoon ^[2]; Huefner, Magdalena ^[2]; Ye, Cun ^[3]; Kim, Stella ^[4]; Canfield, Paul C. ^[4]; Prozorov, Ruslan ^[4]; Auslaender, Ophir M. ^[5]; Hoffman, Jennifer E. ^[2]

Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Harvard Univ., Cambridge, MA (United States)
Tsinghua Univ., Beijing (China)
Iowa State Univ., Ames, IA (United States)
Israel Institute of Technology, Haifa (Israel)

We use a magnetic force microscope (MFM) to investigate single vortex pinning and penetration depth in NdFeAsO_1-xF_x, one of the highest-T_c iron-based superconductors. In fields up to 20 Gauss, we observe a disordered vortex arrangement, implying that the pinning forces are stronger than the vortex-vortex interactions. We measure the typical force to depin a single vortex, F_depin ≃ 4.5 pN, corresponding to a critical current up to J_c ≃ 7×10⁵ A/cm². As a result, our MFM measurements allow the first local and absolute determination of the superconducting in-plane penetration depth in NdFeAsO_1-xF_x, λ_ab = 320 ± 60 nm, which is larger than previous bulk measurements.

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Research Organization:: Ames Laboratory (AMES), Ames, IA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-07CH11358; PHY01-17795; 2010305; HU 1960/11

OSTI ID:: 1227430

Alternate ID(s):: OSTI ID: 1224649

Report Number(s):: IS-J-8838; PRBMDO

Journal Information:: Physical Review. B, Condensed Matter and Materials Physics, Vol. 92, Issue 13; ISSN 1098-0121

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 9 works

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