Raman spectroscopy measurement of bilayer graphene's twist angle to boron nitride

Cheng, Bin; Wang, Peng; Pan, Cheng; Miao, Tengfei; Wu, Yong; Taniguchi, T.; Watanabe, K.; Lau, C. N.; Bockrath, M.

doi:10.1063/1.4926918

Title: Raman spectroscopy measurement of bilayer graphene's twist angle to boron nitride

Journal Article · Mon Jul 20 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4926918· OSTI ID:1226778

Cheng, Bin ^[1]; Wang, Peng ^[1]; Pan, Cheng ^[1]; Miao, Tengfei ^[1]; Wu, Yong ^[1]; Taniguchi, T. ^[2];

^[2]; Lau, C. N. ^[1]; Bockrath, M. ^[1]

Department of Physics and Astronomy, University of California, Riverside, California 92521, USA
Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan

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Sponsoring Organization:: USDOE

Grant/Contract Number:: ER 46940-DE-SC0010597

OSTI ID:: 1226778

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Vol. 107 Journal Issue: 3; ISSN 0003-6951

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 6 works

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References (25)

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