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Title: 3-D Point Defect Density Distributions in Thin Film Cu(In,Ga)Se2 Measured by Atom Probe Tomography

Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1226163
Report Number(s):
NREL/JA-5K00-62472
Journal ID: ISSN 1359-6454
DOE Contract Number:
AC36-08GO28308
Resource Type:
Journal Article
Resource Relation:
Journal Name: Acta Materialia; Journal Volume: 102; Related Information: Acta Materialia
Publisher:
Elsevier
Research Org:
NREL (National Renewable Energy Laboratory (NREL)
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE Thin film photovoltaics; Ordered vacancy compounds (OVC); Atom probe tomography; Point defect density; Transmission electron microscopy