skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint

Abstract

Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.

Authors:
; ;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
OSTI Identifier:
1225512
Report Number(s):
NREL/CP-5J00-64416
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: 42nd IEEE Photovoltaics Conference;New Orleans, Louisiana; -
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; Multi-junction; characterization; IV

Citation Formats

Moriarty, Tom, France, Ryan, and Steiner, Myles. Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint. United States: N. p., 2015. Web. doi:10.1109/PVSC.2015.7355845.
Moriarty, Tom, France, Ryan, & Steiner, Myles. Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint. United States. https://doi.org/10.1109/PVSC.2015.7355845
Moriarty, Tom, France, Ryan, and Steiner, Myles. 2015. "Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint". United States. https://doi.org/10.1109/PVSC.2015.7355845. https://www.osti.gov/servlets/purl/1225512.
@article{osti_1225512,
title = {Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint},
author = {Moriarty, Tom and France, Ryan and Steiner, Myles},
abstractNote = {Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.},
doi = {10.1109/PVSC.2015.7355845},
url = {https://www.osti.gov/biblio/1225512}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 15 00:00:00 EDT 2015},
month = {Tue Sep 15 00:00:00 EDT 2015}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: