Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint
Abstract
Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.
- Authors:
- Publication Date:
- Research Org.:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- OSTI Identifier:
- 1225512
- Report Number(s):
- NREL/CP-5J00-64416
- DOE Contract Number:
- AC36-08GO28308
- Resource Type:
- Conference
- Resource Relation:
- Conference: 42nd IEEE Photovoltaics Conference;New Orleans, Louisiana; -
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 36 MATERIALS SCIENCE; Multi-junction; characterization; IV
Citation Formats
Moriarty, Tom, France, Ryan, and Steiner, Myles. Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint. United States: N. p., 2015.
Web. doi:10.1109/PVSC.2015.7355845.
Moriarty, Tom, France, Ryan, & Steiner, Myles. Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint. United States. https://doi.org/10.1109/PVSC.2015.7355845
Moriarty, Tom, France, Ryan, and Steiner, Myles. 2015.
"Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint". United States. https://doi.org/10.1109/PVSC.2015.7355845. https://www.osti.gov/servlets/purl/1225512.
@article{osti_1225512,
title = {Rapid, Enhanced IV Characterization of Multi-Junction PV Devices under One Sun at NREL: Preprint},
author = {Moriarty, Tom and France, Ryan and Steiner, Myles},
abstractNote = {Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the reference conditions, but also under controlled variations from the reference conditions. This enhanced data set can improve further iterations of device optimization.},
doi = {10.1109/PVSC.2015.7355845},
url = {https://www.osti.gov/biblio/1225512},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 15 00:00:00 EDT 2015},
month = {Tue Sep 15 00:00:00 EDT 2015}
}
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