High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating

Adnane, L.; Williams, N.; Silva, H.; Gokirmak, A.

doi:10.1063/1.4934577

Title: High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating

Journal Article · Wed Oct 28 00:00:00 EDT 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4934577· OSTI ID:1224580

^[1]; Williams, N. ^[1];

^[1]; Gokirmak, A. ^[1]

Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA

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Sponsoring Organization:: USDOE

Grant/Contract Number:: FG02-10ER46774; SC0005038

OSTI ID:: 1224580

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Vol. 86 Journal Issue: 10; ISSN 0034-6748

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 14 works

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References (9)

High-temperature thermoelectric transport at small scales: Thermal generation, transport and recombination of minority carriers Bakan, Gokhan; Khan, Niaz; Silva, Helena Scientific Reports, Vol. 3, Issue 1 https://doi.org/10.1038/srep02724	journal	September 2013
Apparatus for Seebeck coefficient and electrical resistivity measurements of bulk thermoelectric materials at high temperature Zhou, Zhenhua; Uher, Ctirad Review of Scientific Instruments, Vol. 76, Issue 2 https://doi.org/10.1063/1.1835631	journal	February 2005
A hot probe setup for the measurement of Seebeck coefficient of thin wires and thin films using integral method Sarath Kumar, S. R.; Kasiviswanathan, S. Review of Scientific Instruments, Vol. 79, Issue 2 https://doi.org/10.1063/1.2869039	journal	January 2008
Effects of a Magnetic Field on the Thermoelectric Properties of a Bismuth‐Antimony Alloy Wolfe, R.; Smith, G. E. Applied Physics Letters, Vol. 1, Issue 1 https://doi.org/10.1063/1.1777361	journal	September 1962
Thermoelectrics Nolas, George S.; Sharp, Jeffrey; Goldsmid, H. Julian Springer Series in Materials Science https://doi.org/10.1007/978-3-662-04569-5	book	January 2001
An apparatus for simultaneous measurement of electrical conductivity and thermopower of thin films in the temperature range of 300–750 K Ravichandran, J.; Kardel, J. T.; Scullin, M. L. Review of Scientific Instruments, Vol. 82, Issue 1 https://doi.org/10.1063/1.3529438	journal	January 2011
A high temperature apparatus for measurement of the Seebeck coefficient Iwanaga, Shiho; Toberer, Eric S.; LaLonde, Aaron Review of Scientific Instruments, Vol. 82, Issue 6 https://doi.org/10.1063/1.3601358	journal	June 2011
High temperature Seebeck coefficient metrology Martin, J.; Tritt, T.; Uher, C. Journal of Applied Physics, Vol. 108, Issue 12, Article No. 121101 https://doi.org/10.1063/1.3503505	journal	December 2010
Modeling of carrier mobility against carrier concentration in arsenic-, phosphorus-, and boron-doped silicon Masetti, G.; Severi, M.; Solmi, S. IEEE Transactions on Electron Devices, Vol. 30, Issue 7 https://doi.org/10.1109/T-ED.1983.21207	journal	July 1983

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