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Title: A doubly curved elliptical crystal spectrometer for the study of localized x-ray absorption in hot plasmas

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4898339· OSTI ID:1224237
 [1];  [1];  [1];  [1];  [1]
  1. Cornell University, Electrical and Computer Engineering, Ithaca, NY 14853, USA
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Sponsoring Organization:
USDOE
Grant/Contract Number:
NA0001836
OSTI ID:
1224237
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Vol. 85 Journal Issue: 10; ISSN 0034-6748
Publisher:
American Institute of PhysicsCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

References (10)

X-ray reflection properties of elastically bent perfect crystals in Bragg geometry journal June 1993
Picosecond Time-Resolved X-Ray Absorption Spectroscopy of Ultrafast Aluminum Plasmas journal January 2005
Evaluation of the sensitivity and fading characteristics of an image plate system for x-ray diagnostics journal November 2008
Time and space resolved measurement of the electron temperature, mass density and ionization state in the ablation plasma between two exploding Al wires journal May 2012
Impact of the Hall Effect on High-Energy-Density Plasma Jets journal January 2013
Hybrid X-pinch with conical electrodes journal November 2010
Flat and Spherically Bent Muscovite (Mica) Crystals for X-ray Spectroscopy journal February 1998
X-ray absorption spectroscopy measurements of thin foil heating by Z -pinch radiation journal October 2002
High resolution absorption spectroscopy of exploding wire plasmas using an x-pinch x-ray source and spherically bent crystal journal June 2011
Time- and space-resolved elliptical crystal spectrometers for high energy density physics research journal October 2004

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