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Title: Influence of the thickness of a crystal on the electrical characteristics of Cd(Zn)Te detectors

We studied the electrical characteristics of Cd(Zn)Te detectors with rectifying contacts and varying thicknesses, and established that their geometrical dimensions affect the measured electrical properties. We found that the maximum value of the operating-bias voltage and the electric field in the detector for acceptable values of the dark current can be achieved when the crystal has an optimum thickness. This finding is due to the combined effect of generation-recombination in the space-charge region and space-charge limited currents (SCLC).
 [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [2]
  1. Chernivtsi National Univ. (Ukraine)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
OSTI Identifier:
Report Number(s):
R&D Project: 20062; NN2001000
DOE Contract Number:
Resource Type:
Technical Report
Resource Relation:
Related Information: SPIE OPTICS and PHOTONIC; San Diego, CA; 20150809 through 20150816
Research Org:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA), Office of Nonproliferation and Verification Research and Development (NA-22)
Country of Publication:
United States
36 MATERIALS SCIENCE Cd(Zn)Te; detectors; electrical characteristics; I-V curves; space-charge limited currents (SCLC)