Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structure

Sun, C. J.; Chow, G. M.; Han, S. -W.; Wang, J. P.; Hwu, Y. K.; Je, J. H.

doi:10.1063/1.2188041

Title: Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structure

Journal Article · Mon Mar 20 00:00:00 EST 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2188041· OSTI ID:1223951

Sun, C. J. ^[1]; Chow, G. M. ^[2]; Han, S. -W. ^[3]; Wang, J. P. ^[4]; Hwu, Y. K. ^[5]; Je, J. H. ^[6]

National Univ. of Singapore (Singapore); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
National Univ. of Singapore (Singapore)
Chonbuk National Univ., Jeonju (Korea)
Univ. of Minnesota, Minneapolis, MN (United States)
Academia Sinica, Taiwan (China)
Pohang Univ. of Science and Technology, Pohang (Korea)

The phase miscibility of Co, Cr and Pt in oriented nanostructured CoCrPt magnetic thin films was investigated using anomalous x-ray scattering (AXS) from the (002) reflection and extended x-ray absorption fine structure (EXAFS) at CoK, CrK and PtLIII edges. The AXS measurements at CoK edge clearly showed the presence of Co in the crystalline region. However, Cr was not detected in the lattice. The EXAFS at CoK edge indicated that the nearest neighboring atoms of Co were mixed with 80% Co and 20% Pt, consistent with the results of EXAFS at PtLIII edge. Our observations suggested that only Pt and Co were at the Co (002) lattice of the nanotextured CoCrPt thin films. Here, this indicated that the AXS alone may not be reliable to determine the phase miscibility in textured thin films. Complementary information from the EXAFS was useful to understand the phase miscibility of nanoscale materials.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); NUS Academic Research Grant; US Department of the Navy, Office of Naval Research (ONR)

Grant/Contract Number:: W-31-109-ENG-38

OSTI ID:: 1223951

Journal Information:: Applied Physics Letters, Vol. 88, Issue 12; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: ENGLISH

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Cited by: 1 work

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36 MATERIALS SCIENCE
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Title: Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structure

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