New characterization techniques for LSST sensors

Nomerotski, A.

doi:10.1088/1748-0221/10/06/C06010

Title: New characterization techniques for LSST sensors

Journal Article · Thu Jun 18 00:00:00 EDT 2015 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/10/06/C06010· OSTI ID:1221754

Nomerotski, A. ^[1]

Brookhaven National Lab. (BNL), Upton, NY (United States)

Fully depleted, thick CCDs with extended infra-red response have become the sensor of choice for modern sky surveys. The charge transport effects in the silicon and associated astrometric distortions could make mapping between the sky coordinates and sensor coordinates non-trivial, and limit the ultimate precision achievable with these sensors. Two new characterization techniques for the CCDs, which both could probe these issues, are discussed: x-ray flat fielding and imaging of pinhole arrays.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), High Energy Physics (HEP)

Grant/Contract Number:: SC00112704

OSTI ID:: 1221754

Report Number(s):: BNL-108380-2015-JA; KA2301020; TRN: US1500739

Journal Information:: Journal of Instrumentation, Vol. 10, Issue 06; ISSN 1748-0221

Publisher:: Institute of Physics (IOP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 3 works

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References (7)

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Mapping charge transport effects in thick CCDs with a dithered array of 40,000 stars Bradshaw, A.; Lage, C.; Resseguie, E. Journal of Instrumentation, Vol. 10, Issue 04 https://doi.org/10.1088/1748-0221/10/04/C04034	journal	April 2015

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