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Title: Highly Stable Two-Dimensional Silicon Phosphides: Different Stoichiometries and Exotic Electronic Properties; Article No. 121401(R)

Journal Article · · Physical Review. B, Condensed Matter and Materials Physics

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Oak Ridge Leadership Computing Facility (OLCF); National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Contributing Organization:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
OSTI ID:
1220735
Report Number(s):
NREL/JA-5K00-64155
Journal Information:
Physical Review. B, Condensed Matter and Materials Physics, Vol. 91, Issue 12
Country of Publication:
United States
Language:
English

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Exploration of the strain and thermoelectric properties of hexagonal SiX (X = N, P, As, Sb, and Bi) monolayers journal January 2020
Electronic, transport, and optical properties of atomically thin silicon phosphide: first-principles calculations journal November 2018
Single-layer group IV-V and group V-IV-III-VI semiconductors: Structural stability, electronic structures, optical properties, and photocatalysis journal July 2017
Half-metallicity in honeycomb-kagome-lattice Mg3C2 monolayer with carrier doping text January 2017