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Title: Proof-of-Concept Framework to Separate Recombination Processes in Thin Silicon Wafers using Transient Free-Carrier Absorption Spectroscopy; Article No. 105701

Authors:
; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1220730
Report Number(s):
NREL/JA-5J00-64066
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 10
Research Org:
NREL (National Renewable Energy Laboratory (NREL), Golden, CO (United States))
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
Contributing Orgs:
Massachusetts Institute of Technology, Cambridge, Massachusetts
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE Surface passivation; Electrons; Carrier density; Oxide surfaces; Silicon