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Title: Processing and Device Oriented Approach to CIGS Module Reliability; SunShot Initiative, U.S. Department of Energy (DOE)

Abstract: A device level understanding of thin film module reliability has been lacking. We propose that device performance and stability issues are strongly coupled and simultaneous attention to both is necessary. Commonly discussed technical issues such as light soaking, metastability, reverse bias breakdown and junction breakdown can be understood by comparing the behaviors of cells made inAbstract: A device level understanding of thin film module reliability has been lacking. We propose that device performance and stability issues are strongly coupled and simultaneous attention to both is necessary. Commonly discussed technical issues such as light soaking, metastability, reverse bias breakdown and junction breakdown can be understood by comparing the behaviors of cells made in the laboratory and industry. It will then be possible to attribute the observed effects in terms of processing and cell design. Process connection to stability studies can help identify root causes and a path for mitigating the degradation.
Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1215146
Report Number(s):
NREL/PO-5K00-63826
Resource Type:
Conference
Resource Relation:
Conference: 2015 NREL PV Photovoltaic Module Reliability Workshop, 24-27 February 2015, Golden, Colorado
Research Org:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; THIN FILM PHOTOVOLTAICS; RELIABILITY; PROCESSING; DEVICE PHYSICS