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Title: Study of V and Y Shape Frank-Type Stacking Faults Formation in 4H-SiC Epilayer

Journal Article · · Materials Science Forum (Online)

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Sponsoring Organization:
USDOE Office of Science (SC)
OSTI ID:
1212219
Journal Information:
Materials Science Forum (Online), Vol. 778; ISSN 1662-9752
Country of Publication:
United States
Language:
ENGLISH

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