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Title: Band excitation method applicable to scanning probe microscopy

Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.
Authors:
;
Publication Date:
OSTI Identifier:
1207241
Report Number(s):
9,097,738
13/886,748
DOE Contract Number:
AC05-00OR22725
Resource Type:
Patent
Resource Relation:
Patent File Date: 2013 May 03
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY