Application of Direct Current Potential Drop for the J-integral vs. Crack Growth Resistance Curve Characterization
- ORNL
The direct current potential drop (DCPD) technique has been applied to derive the J-integral vs. crack growth resistance curve (J-R curve) for fracture toughness characterization of structural materials. The test matrix covered three materials including type 316LN stainless steels, Ni-based alloy 617, and one ferritic-martensitic steel, three specimen configurations including standard compact, single edge bending, and disk-shaped compact specimens, and temperatures ranging from 20 C to 650 C. When compared with baseline J-R curves derived from the ASTM normalization method, the original J-R curves from the DCPD technique yielded much smaller Jq values due to the influence of crack blunting, plastic deformation, etc. on potential drop. To counter these effects, a new procedure for adjusting DCPD J-R curves was proposed. After applying the new adjustment procedure, the average difference in Jq between the DCPD technique and the normalization method was only 5.2% and the difference in tearing modulus was 7.4%. The promising result demonstrates the applicability of the DCPD technique for the J-R curve characterization especially in extreme environments, such as elevated temperatures, where the conventional elastic unloading compliance method faces considerable challenges.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- Work for Others (WFO)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1207046
- Resource Relation:
- Conference: Fourth Symposium on the Evaluation of Existing and New Sensor Technologies for Fatigue, Fracture and Mechanical Testing, Toronto, Canada, 20140507, 20140508
- Country of Publication:
- United States
- Language:
- English
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