Evaluation of the SEI using a multilayer spectroscopic ellipsometry model
Abstract
A multilayer spectroscopic ellipsometry (SE) model has been developed to characterize SEI formation. The model, which consists of two Cauchy layers, is constructed with an inner layer meant to model primarily inorganic compounds adjacent to an electrode and an outer layer which mirrors polymeric, organic constituents on the exterior of the SEI. Comparison of 1:1 EC:EMC and 1:4 EC:EMC with 1.0 M LiPF₆ shows distinct differences in the two modeled layers. The data suggest that the thickness of both layers change over a wide potential range. These changes have been linked with other reports on the growth of the SEI.
- Authors:
-
- Idaho National Lab. (INL), Idaho Falls, ID (United States)
- Publication Date:
- Research Org.:
- Idaho National Lab. (INL), Idaho Falls, ID (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1193712
- Report Number(s):
- INL/JOU-14-31952
Journal ID: ISSN 2162-8726
- Grant/Contract Number:
- AC07-05ID14517
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- ECS Electrochemistry Letters
- Additional Journal Information:
- Journal Volume: 3; Journal Issue: 11; Journal ID: ISSN 2162-8726
- Publisher:
- Electrochemical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Dufek, Eric J. Evaluation of the SEI using a multilayer spectroscopic ellipsometry model. United States: N. p., 2014.
Web. doi:10.1149/2.0031411eel.
Dufek, Eric J. Evaluation of the SEI using a multilayer spectroscopic ellipsometry model. United States. https://doi.org/10.1149/2.0031411eel
Dufek, Eric J. 2014.
"Evaluation of the SEI using a multilayer spectroscopic ellipsometry model". United States. https://doi.org/10.1149/2.0031411eel. https://www.osti.gov/servlets/purl/1193712.
@article{osti_1193712,
title = {Evaluation of the SEI using a multilayer spectroscopic ellipsometry model},
author = {Dufek, Eric J.},
abstractNote = {A multilayer spectroscopic ellipsometry (SE) model has been developed to characterize SEI formation. The model, which consists of two Cauchy layers, is constructed with an inner layer meant to model primarily inorganic compounds adjacent to an electrode and an outer layer which mirrors polymeric, organic constituents on the exterior of the SEI. Comparison of 1:1 EC:EMC and 1:4 EC:EMC with 1.0 M LiPF₆ shows distinct differences in the two modeled layers. The data suggest that the thickness of both layers change over a wide potential range. These changes have been linked with other reports on the growth of the SEI.},
doi = {10.1149/2.0031411eel},
url = {https://www.osti.gov/biblio/1193712},
journal = {ECS Electrochemistry Letters},
issn = {2162-8726},
number = 11,
volume = 3,
place = {United States},
year = {Thu Aug 28 00:00:00 EDT 2014},
month = {Thu Aug 28 00:00:00 EDT 2014}
}
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