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Title: Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide

Authors:
 [1] ;  [1] ;  [1] ;  [1]
  1. ORNL
Publication Date:
OSTI Identifier:
1185417
DOE Contract Number:
AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Microscopy and Microanalysis, Hartford, CT, USA, 20140803, 20140803
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
ORNL work for others
Country of Publication:
United States
Language:
English