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Title: Secondary Ion Mass Spectrometry for Mg Tracer Diffusion: Issues and Solutions

A Secondary Ion Mass Spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self- diffusivities and the data was verified against historical data measured using radio tracers. The SIMS method has been validated as a reliable alternative to the radio-tracer technique for the measurement of Mg self-diffusion coefficients and can be used as a routine method for determining diffusion coefficients.
Authors:
 [1] ;  [1] ;  [2] ;  [2] ;  [3] ;  [3] ;  [1]
  1. Virginia Polytechnic Institute and State University
  2. ORNL
  3. University of Central Florida
Publication Date:
OSTI Identifier:
1185379
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: 19th International Conference on Secondary Ion Mass Spectrometry SIMS 19, Jeju, South Korea, 20130929, 20131004
Research Org:
Oak Ridge National Laboratory (ORNL)
Sponsoring Org:
EE USDOE - Office of Energy Efficiency and Renewable Energy (EE)
Country of Publication:
United States
Language:
English
Subject:
diffusion; SIMS; magnesium; tracer; self-diffusion