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Title: Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam

Journal Article · · IEEE Transactions on Nuclear Science
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  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  2. TRIUMF, Vancouver, BC (Canada)
  3. IBM, Yorktown Heights, NY (United States)
  4. Vanderbilt Univ., Nashville, TN (United States)
  5. NASA Goddard Space Flight Center, Greenbelt, MD (United States)
  6. NASA, Brookneal, VA (United States)

The low-energy proton energy spectra of all shielded space environments have the same shape. This shape is easily reproduced in the laboratory by degrading a high-energy proton beam, producing a high-fidelity test environment. We use this test environment to dramatically simplify rate prediction for proton direct ionization effects, allowing the work to be done at high-energy proton facilities, on encapsulated parts, without knowledge of the IC design, and with little or no computer simulations required. Proton direct ionization (PDI) is predicted to significantly contribute to the total error rate under the conditions investigated. Scaling effects are discussed using data from 65-nm, 45-nm, and 32-nm SOI SRAMs. These data also show that grazing-angle protons will dominate the PDI-induced error rate due to their higher effective LET, so PDI hardness assurance methods must account for angular effects to be conservative. As a result, we show that this angular dependence can be exploited to quickly assess whether an IC is susceptible to PDI.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1184490
Report Number(s):
SAND-2014-18832J; 540512
Journal Information:
IEEE Transactions on Nuclear Science, Vol. 61, Issue 6; ISSN 0018-9499
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 32 works
Citation information provided by
Web of Science

Cited By (1)

The Effect of Energy Loss Straggling on SEUs Induced by Low-Energy Protons in 28 nm FDSOI SRAMs journal August 2019