Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC02–98CH10886
- OSTI ID:
- 1179631
- Journal Information:
- APL Materials, Journal Name: APL Materials Vol. 2 Journal Issue: 9; ISSN 2166-532X
- Publisher:
- American Institute of PhysicsCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 21 works
Citation information provided by
Web of Science
Web of Science
Similar Records
Thickness Determination of Few-Layer Hexagonal Boron Nitride Films by Scanning Electron Microscopy and Auger Electron Spectroscopy
Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy
Characterization of two-dimensional hexagonal boron nitride using scanning electron and scanning helium ion microscopy
Journal Article
·
Wed Jul 16 00:00:00 EDT 2014
· APL Materials
·
OSTI ID:1179631
Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy
Journal Article
·
Mon Sep 01 00:00:00 EDT 2014
· APL Materials
·
OSTI ID:1179631
Characterization of two-dimensional hexagonal boron nitride using scanning electron and scanning helium ion microscopy
Journal Article
·
Mon Jan 20 00:00:00 EST 2014
· Applied Physics Letters
·
OSTI ID:1179631
+2 more