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Title: Measuring the X-ray Resolving Power of Bent Potassium Acid Phthalate Diffraction Crystals

This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals that we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories (SNL) in Albuquerque, NM. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a dual goniometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.
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  1. NSTec
  2. SNL
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Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 11; Conference: 20th Topical Conference on High-Temperature Plasma Diagnostics, Atlanta, GA, June 2014; Related Information: This is the version that was submitted to the journal. This is not the final peer-reviewed version.
Research Org:
Nevada Test Site/National Security Technologies, LLC (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States