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Title: Systems and methods for sample analysis

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Authors:
; ; ;
Publication Date:
OSTI Identifier:
1167213
Report Number(s):
8,932,875
13/977,758
DOE Contract Number:
FG02-06ER15807
Resource Type:
Patent
Resource Relation:
Patent File Date: 2011 Dec 29
Research Org:
Purdue Research Foundation, West Lafayette, IN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING