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Title: Systems and methods for sample analysis

Patent ·
OSTI ID:1167213
; ; ;

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

Research Organization:
Purdue Univ., West Lafayette, IN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-06ER15807
Assignee:
Purdue Research Foundation (West Lafayette, IN)
Patent Number(s):
8,932,875
Application Number:
13/977,758
OSTI ID:
1167213
Resource Relation:
Patent File Date: 2011 Dec 29
Country of Publication:
United States
Language:
English

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