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Title: Exchange bias in polycrystalline magnetite films made by ion-beam assisted deposition

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4900747· OSTI ID:1166845
 [1];  [2];  [1];  [3]; ORCiD logo [3];  [4]; ORCiD logo [5]
  1. Univ. of Idaho, Moscow, ID (United States)
  2. Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
  3. Univ. of California, Davis, CA (United States)
  4. Univ. of Nebraska Medical Center, Omaha, NE (United States)
  5. Pacific Northwest National Lab. (PNNL), Richland, WA (United States); Washington State Univ., Pullman, WA (United States)

Iron oxide films were deposited onto Si substrates using ion-beam-assisted deposition. The films were ~300 nm thick polycrystalline magnetite with an average crystallite size of ~6 nm. Additionally, incorporation of significant fractions of argon in the films from ion bombardment is evident from chemical analysis, and Fe/O ratios are lower than expected from pure magnetite. However, Raman spectroscopy and x-ray diffraction both indicate that the films are single-phase magnetite. Since no direct evidence of a second phase could be found, exchange bias likely arises due to defects at grain boundaries, possibly amorphous, creating frustrated spins. Since these samples have such small grains, a large fraction of the material consists of grain boundaries, where spins are highly disordered and reverse independently with external field. Furthermore, the high energy deposition process results in an oxygen-rich, argon-containing magnetite film with low temperature exchange bias due to defects at the high concentration of grain boundaries.

Research Organization:
Pacific Northwest National Laboratory (PNNL), Richland, WA (United States). Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC05-76RL01830
OSTI ID:
1166845
Alternate ID(s):
OSTI ID: 1420483
Report Number(s):
PNNL-SA-104251; 44713
Journal Information:
Journal of Applied Physics, Vol. 116, Issue 17; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

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Cited By (1)

Microstructure, magnetic properties and the giant magnetoimpedance effect of amorphous CoSiB thin films deposited by different preparation methods journal October 2018

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