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Title: Dual-Sensor Technique for Characterization of Carrier Lifetime Decay Transients in Semiconductors

Authors:
; ; ;
Publication Date:
OSTI Identifier:
1166656
DOE Contract Number:
AC36-08GO28308
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 21; Related Information: Article No. 214510
Publisher:
American Institute of Physics (AIP)
Research Org:
National Renewable Energy Laboratory (NREL), Golden, CO.
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy Solar Energy Technologies Office
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS Solar Energy - Photovoltaics