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Title: Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation

Authors:
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Publication Date:
OSTI Identifier:
1166655
DOE Contract Number:
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Advances in the Characterization, Performance and Defect Engineering of Earth Abundant and Thin-Film Materials for Solar Energy Conversion - 2014: Proceedings of the Materials Research Society Spring Meeting, 6-10 April 2014, San Francisco, California; Materials Research Society Symposium Proceedings, Vol. 1670
Publisher:
Warrendale, PA: Materials Research Society (MRS)
Research Org:
National Renewable Energy Laboratory (NREL), Golden, CO.
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy Solar Energy Technologies Office
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE Solar Energy - Photovoltaics