Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation

Conference · Wed Jan 01 00:00:00 EST 2014

DOI:https://doi.org/10.1557/opl.2014.591· OSTI ID:1166655

Sopori, B.; Devayajanam, S.; Basnyat, P.; Mehta, V.; Moutinho, H.; Nemeth, B.; LaSalvia, V.; Johnston, S.; Ravindra, N. M.; Binns, J.; Appel, J.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 1166655
• Resource Relation: Conference: Advances in the Characterization, Performance and Defect Engineering of Earth Abundant and Thin-Film Materials for Solar Energy Conversion - 2014: Proceedings of the Materials Research Society Spring Meeting, 6-10 April 2014, San Francisco, California; Materials Research Society Symposium Proceedings, Vol. 1670
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
Solar Energy - Photovoltaics