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Title: A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images

Authors:
; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1165976
Report Number(s):
BNL--107236-2014-JA
R&D Project: 16060; KC0403020
DOE Contract Number:
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 10
Research Org:
Brookhaven National Laboratory (BNL) Center for Functional Nanomaterials
Sponsoring Org:
USDOE SC OFFICE OF BASIC ENERGY SCIENCES
Country of Publication:
United States
Language:
English
Subject:
29 ENERGY PLANNING, POLICY, AND ECONOMY 4H-SiC; stacking fault; HRTEM; functional nanomaterials