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Title: Synchrotron X-ray Topography Studies of the Evolution of the Defect Microstructure in Physical Vapor Transport Grown 4H-SiC Single Crystals

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1162973
Report Number(s):
BNL--106919-2014-JA
DOE Contract Number:
DE-AC02-98CH10886
Resource Type:
Journal Article
Resource Relation:
Journal Name: ECS Transactions; Journal Volume: 2013; Journal Issue: 58
Research Org:
Brookhaven National Laboratory (BNL)
Sponsoring Org:
USDOE SC OFFICE OF SCIENCE (SC)
Country of Publication:
United States
Language:
English