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Title: Fundamental Resolution Limits during Electron-Induced Direct-Write Synthesis

Journal Article · · ACS Applied Materials & Interfaces
DOI:https://doi.org/10.1021/am5008003· OSTI ID:1162090
 [1];  [2];  [3];  [4];  [4];  [2];  [5]
  1. Graz University of Technology, Institute for Electron Microscopy and Nanoanalysis
  2. University of Tennessee, Knoxville (UTK)
  3. ORNL
  4. Graz Centre for Electron Microscopy
  5. Graz University of Technology

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
DE-AC05-00OR22725
OSTI ID:
1162090
Journal Information:
ACS Applied Materials & Interfaces, Vol. 6, Issue 10; ISSN 1944--8244
Country of Publication:
United States
Language:
English

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