Dosimetry implant for treating restenosis and hyperplasia
Patent
·
OSTI ID:1159837
The present invention discloses a method of selectively providing radiation dosimetry to a subject in need of such treatment. The radiation is applied by an implant comprising a body member and .sup.117mSn electroplated at selected locations of the body member, emitting conversion electrons absorbed immediately adjacent selected locations while not affecting surrounding tissue outside of the immediately adjacent area.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-98CH10886
- Assignee:
- SnIP Holdings, Inc. (The Woodlands, TX)
- Patent Number(s):
- 8,834,338
- Application Number:
- 11/758,937
- OSTI ID:
- 1159837
- Country of Publication:
- United States
- Language:
- English
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