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Title: Spatially resolved imaging of opto-electrical property variations

Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.
Authors:
; ; ; ;
Publication Date:
OSTI Identifier:
1159516
Report Number(s):
8,836,944
13/629,320
DOE Contract Number:
AC02-06CH11357
Resource Type:
Patent
Research Org:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION