skip to main content

Title: Degradation of TiN coatings on inconel 617 and silicon wafer substrates under pulsed laser ablation

Authors:
 [1] ;  [1] ;  [2] ;  [3] ;  [4]
  1. Pusan National University, Busan, Korea
  2. Colorado School of Mines, Golden
  3. ORNL
  4. Korea Testing Laboratory (KTL), South Korea
Publication Date:
OSTI Identifier:
1158755
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Materials Engineering and Performance; Journal Volume: 23; Journal Issue: 5
Research Org:
Oak Ridge National Laboratory (ORNL)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English