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Title: Density Profiles of Liquid/Vapor Interfaces Away from Their Critical Points

We examine the applicability of various model profiles for the liquid/vapor interface by X-ray reflectivities on water and ethanol and their mixtures at room temperature. Analysis of the X-ray reflecivities using various density profiles shows an error-function like profile is the most adequate within experimental error. Our findings, together with recent observations from simulation studies on liquid surfaces, strongly suggest that the capillary-wave dynamics shapes the interfacial density profile in terms of the error function.
Authors:
; ;
Publication Date:
OSTI Identifier:
1157657
Report Number(s):
IS-J 8371
Journal ID: ISSN 1932-7447
DOE Contract Number:
DE-AC02-07CH11358
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Physical Chemistry. C; Journal Volume: 118; Journal Issue: 23
Publisher:
American Chemical Society
Research Org:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE fluctuations, fluid, free energy, INTERFACES, scattering, surface, thermal capillary waves, thickness, vapor interface, x-ray reflectivity