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Title: Aberration-corrected 4-detector STEM-EDS analysis of embedded nanoclusters

Authors:
 [1] ;  [1]
  1. ORNL
Publication Date:
OSTI Identifier:
1154810
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: Microscopy and Microanalysis, Hartford, CT, USA, 20140803, 20140803
Research Org:
Oak Ridge National Laboratory (ORNL)
Sponsoring Org:
SC USDOE - Office of Science (SC)
Country of Publication:
United States
Language:
English