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Title: Direct Observation of Atomic Dynamics and Silicon Doping at a Topological Defect in Graphene

Authors:
 [1] ;  [1] ;  [2] ;  [1] ;  [1] ;  [1] ;  [3] ;  [4] ;  [2]
  1. Shenyang National Laboratory for Materials Science
  2. ORNL
  3. Vanderbilt University, Nashville
  4. University of Tennessee, Knoxville (UTK)
Publication Date:
OSTI Identifier:
1150373
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Angewandte Chemie (International Edition); Journal Volume: 53; Journal Issue: 34
Publisher:
Wiley
Research Org:
Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
SC USDOE - Office of Science (SC)
Country of Publication:
United States
Language:
English