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Title: Mode-synthesizing atomic force microscopy and mode-synthesizing sensing

A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.
Authors:
; ;
Publication Date:
OSTI Identifier:
1149602
Report Number(s):
8,789,211
13/897,857
DOE Contract Number:
AC05-000R22725
Resource Type:
Patent
Research Org:
ORNL (Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States))
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY