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Title: X-ray power and yield measurements at the refurbished Z machine

Advancements have been made in the diagnostic techniques to measure accurately the total radiated x-ray yield and power from z-pinch loads at the Z Machine with high accuracy. The Z-accelerator is capable of outputting 2MJ and 330 TW of x-ray yield and power, and accurately measuring these quantities is imperative. We will describe work over the past several years which include the development of new diagnostics, improvements to existing diagnostics, and implementation of automated data analysis routines. A set of experiments were conducted on the Z machine where the load and machine configuration were held constant. During this shot series, it was observed that total z-pinch x-ray emission power determined from the two common techniques for inferring the x-ray power, Kimfol filtered x-ray diode diagnostic and the Total Power and Energy diagnostic gave 450 TW and 327 TW respectively. Our analysis shows the latter to be the more accurate interpretation. More broadly, the comparison demonstrates the necessity to consider spectral response and field of view when inferring xray powers from z-pinch sources.
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  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
OSTI Identifier:
Report Number(s):
Journal ID: ISSN 0034-6748; RSINAK; 518375
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 85; Journal Issue: 8; Journal ID: ISSN 0034-6748
American Institute of Physics (AIP)
Research Org:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States