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Title: Localization of Conductive Filaments in TaOx Memristor using Focused Ion Beam Irradiation.

Abstract not provided.
Authors:
; ; ; ; ;
Publication Date:
OSTI Identifier:
1145692
Report Number(s):
SAND2014-4267C
518378
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the CAARI 2014 held May 25-30, 2014 in San Antonio, TX.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, Albuquerque, NM
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English