skip to main content

Title: Trap-Related Parametric Shifts under DC Bias and Switched Operation Life Stress in Power AlGaN/GaN HEMTs.

Abstract not provided.
Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
1145677
Report Number(s):
SAND2014-4202C
518350
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the International Reliability Physics Symposium held June 1-5, 2014 in Waikoloa, HI.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English