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Title: Using X-mode L, R and O-mode reflectometry cutoffs to measure scrape-off-layer density profiles for upgraded ORNL reflectometer on NSTX-U

Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [2] ;  [1] ;  [2]
  1. ORNL
  2. Princeton Plasma Physics Laboratory (PPPL)
Publication Date:
OSTI Identifier:
1143592
DOE Contract Number:
DE-AC05-00OR22725
Resource Type:
Conference
Resource Relation:
Conference: High Temperature Plasma Diagnostics 2014, Atlanta, GA, USA, 20140601, 20140605
Research Org:
Oak Ridge National Laboratory (ORNL)
Sponsoring Org:
SC USDOE - Office of Science (SC)
Country of Publication:
United States
Language:
English