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Title: A Framework to Quantify FPGA Design Hardness Against Radiation-Induced Single Event Effects.

Abstract not provided.
Authors:
;
Publication Date:
OSTI Identifier:
1141664
Report Number(s):
SAND2014-2449C
506491
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Midwest Symposium on Circuits and Systems held August 3-6, 2014 in College Station, TX.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English