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Title: Radiation Effects Microscopy in Microelectronic Devices Using a Heavy Ion Nuclear Microprobe.

Abstract not provided.
Authors:
Publication Date:
OSTI Identifier:
1141451
Report Number(s):
SAND2014-2545C
506322
DOE Contract Number:
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the International Conference on Nuclear Microprobe Technology and Applications held July 7-11, 2014 in Padua, Italy.
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English