X-ray Pinhole Camera Measurements

Conference · Mon Jul 01 00:00:00 EDT 2013 · Proceedings of 2013 IEEE International Pulsed Power and Plasma Science Conference

DOI:https://doi.org/10.1109/PPC.2013.6627633· OSTI ID:1136202

Nelson, D. S. ^[1]; Berninger, M. J. ^[1]; Flores, P. A. ^[1]; Good, D. E. ^[1]; Henderson, D. J. ^[1]; Hogge, K. W. ^[1]; Huber, S. R. ^[1]; Lutz, S. S. ^[1]; Mitchell, S. E. ^[1]; Howe, R. A. ^[1]; Mitton, C. V. ^[1]; Molina, I. ^[1]; Bozman, D. R. ^[2]; Cordova, S. R. ^[2]; Mitchell, D. R. ^[2]; Oliver, B. V. ^[2]; Ormond, E. C. ^[2]

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1. NSTec
2. SNL

The development of the rod pinch diode [1] has led to high-resolution radiography for dynamic events such as explosive tests. Rod pinch diodes use a small diameter anode rod, which extends through the aperture of a cathode plate. Electrons borne off the aperture surface can self-insulate and pinch onto the tip of the rod, creating an intense, small x-ray source (Primary Pinch). This source has been utilized as the main diagnostic on numerous experiments that include high-value, single-shot events. In such applications there is an emphasis on machine reliability, x-ray reproducibility, and x-ray quality [2]. In tests with the baseline rod pinch diode, we have observed that an additional pinch (Secondary Pinch) occurs at the interface near the anode rod and the rod holder. This suggests that stray electrons exist that are not associated with the Primary Pinch. In this paper we present measurements on both pinches using an x-ray pinhole camera. The camera is placed downstream of the Primary Pinch at an angle of 60° with respect to the diode centerline. This diagnostic will be employed to diagnose x-ray reproducibility and quality. In addition, we will investigate the performance of hybrid diodes relating to the formation of the Primary and Secondary Pinches.

• Research Organization: Nevada Test Site (NTS), Mercury, NV (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP)
• DOE Contract Number: DE-AC52-06NA25946
• OSTI ID: 1136202
• Report Number(s): DOE/NV/25946-1799
• Journal Information: Proceedings of 2013 IEEE International Pulsed Power and Plasma Science Conference, Conference: 2013 IEEE International Pulsed Power and Plasma Science Conference, June 16-21, 2013
• Country of Publication: United States
• Language: English

Related Subjects

X-RAY
pinhole
camera
measurements
rod pinch diode