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Title: Measuring Refractive Index Profiles within Thin-Film Photovoltaics with High Spatial Resolution using the Modified IM-IWKB Method

Authors:
;
Publication Date:
OSTI Identifier:
1133594
Report Number(s):
BNL--105048-2014-CP
YN0100000
DOE Contract Number:
DE-AC02-98CH10886
Resource Type:
Conference
Resource Relation:
Conference: 40th IEEE Photovoltaic Specialists Conference; Denver, CO; 20140608 through 20140613
Research Org:
Brookhaven National Laboratory (BNL)
Sponsoring Org:
USDOE SC OFFICE OF SCIENCE (SC)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY