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Title: A Fast, Versatile Nanoprobe for Complex Materials: The Sub-micron Resolution X-ray Spectroscopy Beamline at NSLS-II (491st Brookhaven Lecture)

Time is money and for scientists who need to collect data at research facilities like Brookhaven Lab’s National Synchrotron Light Source (NSLS), “beamtime” can be a precious commodity. While scanning a complex material with a specific technique and standard equipment today would take days to complete, researchers preparing to use brighter x-rays and the new sub-micron-resolution x-ray spectroscopy (SRX) beamline at the National Synchrotron Light Source II (NSLS-II) could scan the same sample in greater detail with just a few hours of beamtime. Talk about savings and new opportunities for researchers! Users will rely on these tools for locating trace elements in contaminated soils, developing processes for nanoparticles to deliver medical treatments, and much more. Dr. Thieme explains benefits for next-generation research with spectroscopy and more intense x-rays at NSLS-II. He discusses the instrumentation, features, and uses for the new SRX beamline, highlighting its speed, adjustability, and versatility for probing samples ranging in size from millimeters down to the nanoscale. He will talk about complementary beamlines being developed for additional capabilities at NSLS-II as well.
Authors:
 [1]
  1. BNL Photon Sciences Directorate
Publication Date:
OSTI Identifier:
1132946
DOE Contract Number:
AC02-98CH10886
Resource Type:
Conference
Resource Relation:
Conference: Brookhaven Lecture Series: 1960 - Present, Lecture presented at Brookhaven National Laboratory, Upton, New York (United States) on February 6, 2014
Research Org:
BNL (Brookhaven National Laboratory (BNL), Upton, NY (United States))
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS Photon Science